Test Date: 2015-06-05 18:06
Chip 10
X-ray Calibration - Target Zn Method Spectrum Chip C10
Center |
Center of Peak |
56.47 ± 0.07 |
Vcal |
TargetEnergy |
Energy of target Zn |
8638.91 |
eV |
TargetNElectrons |
Energy of target Zn |
2399.7 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
68.33 |
|
Rate |
Rate |
374.10 |
kHz/cm² |
X-ray Calibration - Target Mo Method Spectrum Chip C10
Center |
Center of Peak |
107.6 ± 0.06 |
Vcal |
TargetEnergy |
Energy of target Mo |
17479.37 |
eV |
TargetNElectrons |
Energy of target Mo |
4855.38 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
35.23 |
|
Rate |
Rate |
497.30 |
kHz/cm² |
X-ray Calibration - Target Ag Method Spectrum Chip C10
Center |
Center of Peak |
135.63 ± 0.09 |
Vcal |
TargetEnergy |
Energy of target Ag |
22162.92 |
eV |
TargetNElectrons |
Energy of target Ag |
6156.37 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
18.52 |
|
Rate |
Rate |
256.50 |
kHz/cm² |
X-ray Calibration - Target Sn Method Spectrum Chip C10
Center |
Center of Peak |
154.38 ± 0.12 |
Vcal |
TargetEnergy |
Energy of target Sn |
25271.36 |
eV |
TargetNElectrons |
Energy of target Sn |
7019.82 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
11.47 |
|
Rate |
Rate |
159.20 |
kHz/cm² |
X-ray Calibration - Vcal Calibration Method Spectrum Chip C10
Slope |
Slope |
46.314 ± 0.118 |
nElectrons/VCal |
Offset |
Offset |
-127.578 ± 14.567 |
nElectrons |
X-ray Hit Map - Target Zn Method Spectrum Chip C10
Rate |
Rate |
374.10 |
kHz/cm² |
NTrigs |
N Trig |
5913115 |
Trigger |
NHits |
N Hits |
34508 |
Hits |
X-ray Hit Map - Target Mo Method Spectrum Chip C10
Rate |
Rate |
497.30 |
kHz/cm² |
NTrigs |
N Trig |
5913243 |
Trigger |
NHits |
N Hits |
45877 |
Hits |
X-ray Hit Map - Target Ag Method Spectrum Chip C10
Rate |
Rate |
256.50 |
kHz/cm² |
NTrigs |
N Trig |
5913128 |
Trigger |
NHits |
N Hits |
23659 |
Hits |
X-ray Hit Map - Target Sn Method Spectrum Chip C10
Rate |
Rate |
159.20 |
kHz/cm² |
NTrigs |
N Trig |
5912980 |
Trigger |
NHits |
N Hits |
14687 |
Hits |