Test Date: 2015-06-05 18:06
Chip 5
X-ray Calibration - Target Zn Method Spectrum Chip C5
Center |
Center of Peak |
55.11 ± 0.07 |
Vcal |
TargetEnergy |
Energy of target Zn |
8638.91 |
eV |
TargetNElectrons |
Energy of target Zn |
2399.7 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
58.28 |
|
Rate |
Rate |
367.70 |
kHz/cm² |
X-ray Calibration - Target Mo Method Spectrum Chip C5
Center |
Center of Peak |
107.12 ± 0.06 |
Vcal |
TargetEnergy |
Energy of target Mo |
17479.37 |
eV |
TargetNElectrons |
Energy of target Mo |
4855.38 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
30.53 |
|
Rate |
Rate |
495.20 |
kHz/cm² |
X-ray Calibration - Target Ag Method Spectrum Chip C5
Center |
Center of Peak |
135.35 ± 0.09 |
Vcal |
TargetEnergy |
Energy of target Ag |
22162.92 |
eV |
TargetNElectrons |
Energy of target Ag |
6156.37 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
14.69 |
|
Rate |
Rate |
254.70 |
kHz/cm² |
X-ray Calibration - Target Sn Method Spectrum Chip C5
Center |
Center of Peak |
154.09 ± 0.11 |
Vcal |
TargetEnergy |
Energy of target Sn |
25271.36 |
eV |
TargetNElectrons |
Energy of target Sn |
7019.82 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
10.88 |
|
Rate |
Rate |
159.70 |
kHz/cm² |
X-ray Calibration - Vcal Calibration Method Spectrum Chip C5
Slope |
Slope |
46.082 ± 0.112 |
nElectrons/VCal |
Offset |
Offset |
-80.955 ± 13.891 |
nElectrons |
X-ray Hit Map - Target Zn Method Spectrum Chip C5
Rate |
Rate |
367.70 |
kHz/cm² |
NTrigs |
N Trig |
5913115 |
Trigger |
NHits |
N Hits |
33921 |
Hits |
X-ray Hit Map - Target Mo Method Spectrum Chip C5
Rate |
Rate |
495.20 |
kHz/cm² |
NTrigs |
N Trig |
5913243 |
Trigger |
NHits |
N Hits |
45682 |
Hits |
X-ray Hit Map - Target Ag Method Spectrum Chip C5
Rate |
Rate |
254.70 |
kHz/cm² |
NTrigs |
N Trig |
5913128 |
Trigger |
NHits |
N Hits |
23491 |
Hits |
X-ray Hit Map - Target Sn Method Spectrum Chip C5
Rate |
Rate |
159.70 |
kHz/cm² |
NTrigs |
N Trig |
5912980 |
Trigger |
NHits |
N Hits |
14734 |
Hits |