Test Date: 2015-07-07 08:07
Chip 10
Grading
ROCGrade |
Final ROC Grade |
A |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
0/0 |
|
Efficiency |
Efficiency 50/120 |
99.87/99.31 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C10
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.87 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.31 |
|
Efficiency Distr. 150: C10
N |
N |
4160 |
|
mu |
μ |
98.83 |
|
sigma |
σ |
1.87 |
|
Efficiency Distr. 250: C10
N |
N |
4160 |
|
mu |
μ |
97.12 |
|
sigma |
σ |
3.55 |
|
Efficiency Distr. 100: C10
N |
N |
4160 |
|
mu |
μ |
99.53 |
|
sigma |
σ |
1.01 |
|
Efficiency Distr. 50: C10
N |
N |
4160 |
|
mu |
μ |
99.89 |
|
sigma |
σ |
0.46 |
|
Efficiency Distr. 200: C10
N |
N |
4160 |
|
mu |
μ |
97.33 |
|
sigma |
σ |
3.34 |
|
Background Map 150: C10
RealHitrate |
Real Hitrate |
131.67 |
MHz/cm2 |
Background Map 250: C10
RealHitrate |
Real Hitrate |
182.09 |
MHz/cm2 |
Background Map 100: C10
RealHitrate |
Real Hitrate |
91.84 |
MHz/cm2 |
Background Map 50: C10
RealHitrate |
Real Hitrate |
45.96 |
MHz/cm2 |
Background Map 200: C10
RealHitrate |
Real Hitrate |
177.62 |
MHz/cm2 |
Hit Map 50: C10
RealHitrate |
Real Hitrate |
45.23 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 50: C10
Hit Map 150: C10
RealHitrate |
Real Hitrate |
129.92 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 150: C10
Col. Read. Unif. 50: C10
N |
N |
6372672 |
|
mu |
μ |
163471 |
|
sigma |
σ |
404.32 |
|
Col. Read. Unif. 150: C10
N |
N |
18349251 |
|
mu |
μ |
463500 |
|
sigma |
σ |
680.81 |
|
Read. Unif. over Time 50: C10
N |
N |
7317680 |
|
mu |
μ |
7414 |
|
sigma_th |
σ_th |
86.10 |
|
Time unif. distribution 50: C10
chi2/ndf |
chi2/ndf |
0.79 |
|
sigma |
σ |
87.83 |
|
sigma_th |
σ_th |
86.13 |
|
Read. Unif. over Time 150: C10
N |
N |
21016156 |
|
mu |
μ |
21293 |
|
sigma_th |
σ_th |
145.92 |
|
Time unif. distribution 150: C10
chi2/ndf |
chi2/ndf |
3.98 |
|
sigma |
σ |
157.86 |
|
sigma_th |
σ_th |
145.98 |
|
Col. Uniformity Ratio: C10
Col. Uniformity per Event: C10 50
Col. Uniformity per Event: C10 150
S-Curve widths: Noise (e^{-}) C10 100
N |
N |
3892 |
|
mu |
μ |
390.94 |
|
sigma |
σ |
125.66 |
|
threshold |
thr |
3611.27 |
|
fit_peak |
fit peak |
326 |
|
fit_skewness |
ɣ1 |
7.64e-01 |
|
under |
<= |
88.00 |
|
over |
>= |
180.00 |
|