Test Date: 2015-07-07 08:07
Chip 12
Grading
ROCGrade |
Final ROC Grade |
A |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
0/0 |
|
Efficiency |
Efficiency 50/120 |
99.84/99.02 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C12
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.84 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.02 |
|
Efficiency Distr. 150: C12
N |
N |
4160 |
|
mu |
μ |
98.84 |
|
sigma |
σ |
1.70 |
|
Efficiency Distr. 250: C12
N |
N |
4160 |
|
mu |
μ |
97.10 |
|
sigma |
σ |
3.13 |
|
Efficiency Distr. 100: C12
N |
N |
4160 |
|
mu |
μ |
99.56 |
|
sigma |
σ |
0.98 |
|
Efficiency Distr. 50: C12
N |
N |
4160 |
|
mu |
μ |
99.89 |
|
sigma |
σ |
0.46 |
|
Efficiency Distr. 200: C12
N |
N |
4160 |
|
mu |
μ |
97.36 |
|
sigma |
σ |
3.10 |
|
Background Map 150: C12
RealHitrate |
Real Hitrate |
116.46 |
MHz/cm2 |
Background Map 250: C12
RealHitrate |
Real Hitrate |
161.39 |
MHz/cm2 |
Background Map 100: C12
RealHitrate |
Real Hitrate |
80.65 |
MHz/cm2 |
Background Map 50: C12
RealHitrate |
Real Hitrate |
40.38 |
MHz/cm2 |
Background Map 200: C12
RealHitrate |
Real Hitrate |
157.08 |
MHz/cm2 |
Hit Map 50: C12
RealHitrate |
Real Hitrate |
39.96 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 50: C12
Hit Map 150: C12
RealHitrate |
Real Hitrate |
116.42 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 150: C12
Col. Read. Unif. 50: C12
N |
N |
5657493 |
|
mu |
μ |
134574 |
|
sigma |
σ |
366.84 |
|
Col. Read. Unif. 150: C12
N |
N |
16509614 |
|
mu |
μ |
393581 |
|
sigma |
σ |
627.36 |
|
Read. Unif. over Time 50: C12
N |
N |
6465972 |
|
mu |
μ |
6551 |
|
sigma_th |
σ_th |
80.94 |
|
Time unif. distribution 50: C12
chi2/ndf |
chi2/ndf |
0.99 |
|
sigma |
σ |
82.17 |
|
sigma_th |
σ_th |
80.96 |
|
Read. Unif. over Time 150: C12
N |
N |
18832144 |
|
mu |
μ |
19080 |
|
sigma_th |
σ_th |
138.13 |
|
Time unif. distribution 150: C12
chi2/ndf |
chi2/ndf |
1.57 |
|
sigma |
σ |
143.59 |
|
sigma_th |
σ_th |
138.19 |
|
Col. Uniformity Ratio: C12
Col. Uniformity per Event: C12 50
Col. Uniformity per Event: C12 150
S-Curve widths: Noise (e^{-}) C12 100
N |
N |
4110 |
|
mu |
μ |
361.38 |
|
sigma |
σ |
94.18 |
|
threshold |
thr |
3536.29 |
|
fit_peak |
fit peak |
325 |
|
fit_skewness |
ɣ1 |
6.03e-01 |
|
under |
<= |
9.00 |
|
over |
>= |
41.00 |
|