Test Date: 2015-07-07 08:07
Chip 10
Grading
ROCGrade |
Final ROC Grade |
A |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
28/27 |
|
Efficiency |
Efficiency 50/120 |
99.83/99.21 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C10
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.83 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.21 |
|
Efficiency Distr. 150: C10
N |
N |
4160 |
|
mu |
μ |
94.78 |
|
sigma |
σ |
5.07 |
|
Efficiency Distr. 250: C10
N |
N |
4160 |
|
mu |
μ |
87.61 |
|
sigma |
σ |
9.00 |
|
Efficiency Distr. 100: C10
N |
N |
4160 |
|
mu |
μ |
98.20 |
|
sigma |
σ |
2.36 |
|
Efficiency Distr. 50: C10
N |
N |
4160 |
|
mu |
μ |
99.69 |
|
sigma |
σ |
0.81 |
|
Efficiency Distr. 200: C10
N |
N |
4160 |
|
mu |
μ |
88.07 |
|
sigma |
σ |
8.89 |
|
Background Map 150: C10
RealHitrate |
Real Hitrate |
208.56 |
MHz/cm2 |
Background Map 250: C10
RealHitrate |
Real Hitrate |
284.88 |
MHz/cm2 |
Background Map 100: C10
RealHitrate |
Real Hitrate |
146.83 |
MHz/cm2 |
Background Map 50: C10
RealHitrate |
Real Hitrate |
74.88 |
MHz/cm2 |
Background Map 200: C10
RealHitrate |
Real Hitrate |
279.19 |
MHz/cm2 |
Hit Map 50: C10
RealHitrate |
Real Hitrate |
74.23 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
28 |
|
Bump Bonding Defects 50: C10
Hit Map 150: C10
RealHitrate |
Real Hitrate |
208.82 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
27 |
|
Bump Bonding Defects 150: C10
Col. Read. Unif. 50: C10
N |
N |
10543572 |
|
mu |
μ |
269219 |
|
sigma |
σ |
518.86 |
|
Col. Read. Unif. 150: C10
N |
N |
29730201 |
|
mu |
μ |
750439 |
|
sigma |
σ |
866.28 |
|
Read. Unif. over Time 50: C10
N |
N |
12002979 |
|
mu |
μ |
12173 |
|
sigma_th |
σ_th |
110.33 |
|
Time unif. distribution 50: C10
chi2/ndf |
chi2/ndf |
1.42 |
|
sigma |
σ |
113.15 |
|
sigma_th |
σ_th |
110.34 |
|
Read. Unif. over Time 150: C10
N |
N |
33761298 |
|
mu |
μ |
34241 |
|
sigma_th |
σ_th |
185.04 |
|
Time unif. distribution 150: C10
chi2/ndf |
chi2/ndf |
21.90 |
|
sigma |
σ |
221.65 |
|
sigma_th |
σ_th |
185.07 |
|
Col. Uniformity Ratio: C10
Col. Uniformity per Event: C10 50
Col. Uniformity per Event: C10 150
S-Curve widths: Noise (e^{-}) C10 100
N |
N |
3538 |
|
mu |
μ |
420.05 |
|
sigma |
σ |
158.35 |
|
threshold |
thr |
3856.95 |
|
fit_peak |
fit peak |
334 |
|
fit_skewness |
ɣ1 |
8.13e-01 |
|
under |
<= |
195.00 |
|
over |
>= |
427.00 |
|