Test Date: 2015-07-07 08:07
Chip 12
Grading
ROCGrade |
Final ROC Grade |
A |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
17/18 |
|
Efficiency |
Efficiency 50/120 |
99.86/99.3 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C12
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.86 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.30 |
|
Efficiency Distr. 150: C12
N |
N |
4160 |
|
mu |
μ |
97.68 |
|
sigma |
σ |
2.73 |
|
Efficiency Distr. 250: C12
N |
N |
4160 |
|
mu |
μ |
93.94 |
|
sigma |
σ |
5.56 |
|
Efficiency Distr. 100: C12
N |
N |
4160 |
|
mu |
μ |
99.12 |
|
sigma |
σ |
1.46 |
|
Efficiency Distr. 50: C12
N |
N |
4160 |
|
mu |
μ |
99.82 |
|
sigma |
σ |
0.62 |
|
Efficiency Distr. 200: C12
N |
N |
4160 |
|
mu |
μ |
94.26 |
|
sigma |
σ |
5.25 |
|
Background Map 150: C12
RealHitrate |
Real Hitrate |
170.45 |
MHz/cm2 |
Background Map 250: C12
RealHitrate |
Real Hitrate |
234.65 |
MHz/cm2 |
Background Map 100: C12
RealHitrate |
Real Hitrate |
119.18 |
MHz/cm2 |
Background Map 50: C12
RealHitrate |
Real Hitrate |
60.61 |
MHz/cm2 |
Background Map 200: C12
RealHitrate |
Real Hitrate |
229.49 |
MHz/cm2 |
Hit Map 50: C12
RealHitrate |
Real Hitrate |
59.77 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
17 |
|
Bump Bonding Defects 50: C12
Hit Map 150: C12
RealHitrate |
Real Hitrate |
170.62 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
18 |
|
Bump Bonding Defects 150: C12
Col. Read. Unif. 50: C12
N |
N |
8485802 |
|
mu |
μ |
204030 |
|
sigma |
σ |
451.70 |
|
Col. Read. Unif. 150: C12
N |
N |
24258472 |
|
mu |
μ |
586843 |
|
sigma |
σ |
766.06 |
|
Read. Unif. over Time 50: C12
N |
N |
9665312 |
|
mu |
μ |
9803 |
|
sigma_th |
σ_th |
99.01 |
|
Time unif. distribution 50: C12
chi2/ndf |
chi2/ndf |
2.05 |
|
sigma |
σ |
105.49 |
|
sigma_th |
σ_th |
99.02 |
|
Read. Unif. over Time 150: C12
N |
N |
27585148 |
|
mu |
μ |
27977 |
|
sigma_th |
σ_th |
167.26 |
|
Time unif. distribution 150: C12
chi2/ndf |
chi2/ndf |
8.56 |
|
sigma |
σ |
188.72 |
|
sigma_th |
σ_th |
167.29 |
|
Col. Uniformity Ratio: C12
Col. Uniformity per Event: C12 50
Col. Uniformity per Event: C12 150
S-Curve widths: Noise (e^{-}) C12 100
N |
N |
3775 |
|
mu |
μ |
402.14 |
|
sigma |
σ |
145.21 |
|
threshold |
thr |
3808.58 |
|
fit_peak |
fit peak |
326 |
|
fit_skewness |
ɣ1 |
7.62e-01 |
|
under |
<= |
105.00 |
|
over |
>= |
280.00 |
|