Test Date: 2015-07-07 08:07
Chip 14
Grading
ROCGrade |
Final ROC Grade |
B |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
93/92 |
|
Efficiency |
Efficiency 50/120 |
99.87/99.31 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(B)/B |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C14
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.87 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.31 |
|
Efficiency Distr. 150: C14
N |
N |
4160 |
|
mu |
μ |
99.53 |
|
sigma |
σ |
1.00 |
|
Efficiency Distr. 250: C14
N |
N |
4160 |
|
mu |
μ |
98.83 |
|
sigma |
σ |
1.61 |
|
Efficiency Distr. 100: C14
N |
N |
4160 |
|
mu |
μ |
99.78 |
|
sigma |
σ |
0.67 |
|
Efficiency Distr. 50: C14
N |
N |
4160 |
|
mu |
μ |
99.92 |
|
sigma |
σ |
0.39 |
|
Efficiency Distr. 200: C14
N |
N |
4160 |
|
mu |
μ |
99.00 |
|
sigma |
σ |
1.46 |
|
Background Map 150: C14
RealHitrate |
Real Hitrate |
97.22 |
MHz/cm2 |
Background Map 250: C14
RealHitrate |
Real Hitrate |
135.83 |
MHz/cm2 |
Background Map 100: C14
RealHitrate |
Real Hitrate |
66.98 |
MHz/cm2 |
Background Map 50: C14
RealHitrate |
Real Hitrate |
33.20 |
MHz/cm2 |
Background Map 200: C14
RealHitrate |
Real Hitrate |
131.67 |
MHz/cm2 |
Hit Map 50: C14
RealHitrate |
Real Hitrate |
33.01 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
93 |
|
Bump Bonding Defects 50: C14
Hit Map 150: C14
RealHitrate |
Real Hitrate |
97.53 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
92 |
|
Bump Bonding Defects 150: C14
Col. Read. Unif. 50: C14
N |
N |
4829415 |
|
mu |
μ |
85184 |
|
sigma |
σ |
291.86 |
|
Col. Read. Unif. 150: C14
N |
N |
14262930 |
|
mu |
μ |
260466 |
|
sigma |
σ |
510.36 |
|
Read. Unif. over Time 50: C14
N |
N |
5337280 |
|
mu |
μ |
5413 |
|
sigma_th |
σ_th |
73.57 |
|
Time unif. distribution 50: C14
chi2/ndf |
chi2/ndf |
0.95 |
|
sigma |
σ |
74.74 |
|
sigma_th |
σ_th |
73.58 |
|
Read. Unif. over Time 150: C14
N |
N |
15768079 |
|
mu |
μ |
15992 |
|
sigma_th |
σ_th |
126.46 |
|
Time unif. distribution 150: C14
chi2/ndf |
chi2/ndf |
1.72 |
|
sigma |
σ |
133.01 |
|
sigma_th |
σ_th |
126.48 |
|
Col. Uniformity Ratio: C14
Col. Uniformity per Event: C14 50
Col. Uniformity per Event: C14 150
S-Curve widths: Noise (e^{-}) C14 100
N |
N |
3811 |
|
mu |
μ |
406.53 |
|
sigma |
σ |
139.53 |
|
threshold |
thr |
3609.42 |
|
fit_peak |
fit peak |
341 |
|
fit_skewness |
ɣ1 |
7.32e-01 |
|
under |
<= |
91.00 |
|
over |
>= |
258.00 |
|