Test Date: 2015-07-07 08:07
Chip 15
Grading
ROCGrade |
Final ROC Grade |
B |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
51/51 |
|
Efficiency |
Efficiency 50/120 |
99.87/99.33 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(B)/B |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C15
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.87 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.33 |
|
Efficiency Distr. 150: C15
N |
N |
4160 |
|
mu |
μ |
99.63 |
|
sigma |
σ |
0.87 |
|
Efficiency Distr. 250: C15
N |
N |
4160 |
|
mu |
μ |
99.10 |
|
sigma |
σ |
1.46 |
|
Efficiency Distr. 100: C15
N |
N |
4160 |
|
mu |
μ |
99.84 |
|
sigma |
σ |
0.59 |
|
Efficiency Distr. 50: C15
N |
N |
4160 |
|
mu |
μ |
99.94 |
|
sigma |
σ |
0.35 |
|
Efficiency Distr. 200: C15
N |
N |
4160 |
|
mu |
μ |
99.19 |
|
sigma |
σ |
1.37 |
|
Background Map 150: C15
RealHitrate |
Real Hitrate |
89.13 |
MHz/cm2 |
Background Map 250: C15
RealHitrate |
Real Hitrate |
123.81 |
MHz/cm2 |
Background Map 100: C15
RealHitrate |
Real Hitrate |
61.37 |
MHz/cm2 |
Background Map 50: C15
RealHitrate |
Real Hitrate |
30.36 |
MHz/cm2 |
Background Map 200: C15
RealHitrate |
Real Hitrate |
120.48 |
MHz/cm2 |
Hit Map 50: C15
RealHitrate |
Real Hitrate |
30.56 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
51 |
|
Bump Bonding Defects 50: C15
Hit Map 150: C15
RealHitrate |
Real Hitrate |
89.49 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
51 |
|
Bump Bonding Defects 150: C15
Col. Read. Unif. 50: C15
N |
N |
4389302 |
|
mu |
μ |
104799 |
|
sigma |
σ |
323.73 |
|
Col. Read. Unif. 150: C15
N |
N |
12871937 |
|
mu |
μ |
308527 |
|
sigma |
σ |
555.45 |
|
Read. Unif. over Time 50: C15
N |
N |
4942001 |
|
mu |
μ |
5012 |
|
sigma_th |
σ_th |
70.80 |
|
Time unif. distribution 50: C15
chi2/ndf |
chi2/ndf |
1.06 |
|
sigma |
σ |
71.59 |
|
sigma_th |
σ_th |
70.80 |
|
Read. Unif. over Time 150: C15
N |
N |
14468592 |
|
mu |
μ |
14674 |
|
sigma_th |
σ_th |
121.14 |
|
Time unif. distribution 150: C15
chi2/ndf |
chi2/ndf |
2.57 |
|
sigma |
σ |
126.77 |
|
sigma_th |
σ_th |
121.16 |
|
Col. Uniformity Ratio: C15
Col. Uniformity per Event: C15 50
Col. Uniformity per Event: C15 150
S-Curve widths: Noise (e^{-}) C15 100
N |
N |
4153 |
|
mu |
μ |
285.91 |
|
sigma |
σ |
73.41 |
|
threshold |
thr |
3002.69 |
|
fit_peak |
fit peak |
257 |
|
fit_skewness |
ɣ1 |
6.86e-01 |
|
under |
<= |
5.00 |
|
over |
>= |
2.00 |
|