Test Date: 2015-07-07 08:07
Chip 10
Grading
ROCGrade |
Final ROC Grade |
A |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
1/1 |
|
Efficiency |
Efficiency 50/120 |
99.85/99.26 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C10
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.85 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.26 |
|
Efficiency Distr. 150: C10
N |
N |
4160 |
|
mu |
μ |
98.09 |
|
sigma |
σ |
2.65 |
|
Efficiency Distr. 250: C10
N |
N |
4160 |
|
mu |
μ |
95.18 |
|
sigma |
σ |
5.23 |
|
Efficiency Distr. 100: C10
N |
N |
4160 |
|
mu |
μ |
99.28 |
|
sigma |
σ |
1.35 |
|
Efficiency Distr. 50: C10
N |
N |
4160 |
|
mu |
μ |
99.82 |
|
sigma |
σ |
0.62 |
|
Efficiency Distr. 200: C10
N |
N |
4160 |
|
mu |
μ |
95.57 |
|
sigma |
σ |
5.00 |
|
Background Map 150: C10
RealHitrate |
Real Hitrate |
152.83 |
MHz/cm2 |
Background Map 250: C10
RealHitrate |
Real Hitrate |
210.45 |
MHz/cm2 |
Background Map 100: C10
RealHitrate |
Real Hitrate |
106.10 |
MHz/cm2 |
Background Map 50: C10
RealHitrate |
Real Hitrate |
53.63 |
MHz/cm2 |
Background Map 200: C10
RealHitrate |
Real Hitrate |
205.26 |
MHz/cm2 |
Hit Map 50: C10
RealHitrate |
Real Hitrate |
52.99 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
1 |
|
Bump Bonding Defects 50: C10
Hit Map 150: C10
RealHitrate |
Real Hitrate |
151.30 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
1 |
|
Bump Bonding Defects 150: C10
Col. Read. Unif. 50: C10
N |
N |
7450163 |
|
mu |
μ |
192818 |
|
sigma |
σ |
439.11 |
|
Col. Read. Unif. 150: C10
N |
N |
21323503 |
|
mu |
μ |
545594 |
|
sigma |
σ |
738.64 |
|
Read. Unif. over Time 50: C10
N |
N |
8570995 |
|
mu |
μ |
8684 |
|
sigma_th |
σ_th |
93.19 |
|
Time unif. distribution 50: C10
chi2/ndf |
chi2/ndf |
0.54 |
|
sigma |
σ |
95.24 |
|
sigma_th |
σ_th |
93.23 |
|
Read. Unif. over Time 150: C10
N |
N |
24476796 |
|
mu |
μ |
24799 |
|
sigma_th |
σ_th |
157.48 |
|
Time unif. distribution 150: C10
chi2/ndf |
chi2/ndf |
6.82 |
|
sigma |
σ |
177.06 |
|
sigma_th |
σ_th |
157.54 |
|
Col. Uniformity Ratio: C10
Col. Uniformity per Event: C10 50
Col. Uniformity per Event: C10 150
S-Curve widths: Noise (e^{-}) C10 100
N |
N |
3695 |
|
mu |
μ |
436.14 |
|
sigma |
σ |
150.03 |
|
threshold |
thr |
3680.05 |
|
fit_peak |
fit peak |
352 |
|
fit_skewness |
ɣ1 |
8.19e-01 |
|
under |
<= |
141.00 |
|
over |
>= |
324.00 |
|