Test Date: 2016-02-08 10:24Analysis date: 2016-06-20 10:50
FullQualification M2153
Module ID
Test Date
Analysis
Test Type
Grade
Pixel Defects
ROCs < 1%
ROCs > 1%
ROCs > 4%
Noise
Trimming
PHCalibration
I(150V)
I_rec(150V)
IV Slope
Temperature
initial Current
Comments
M2153
2016-02-08 10:24
2016-05-26 09:45
m20_1
B
89
15
1
0
0
0
0
-1.0
-1.0
0.0
-20
0.0
M2153
2016-02-08 10:24
2016-05-26 09:45
m20_2
C
98
15
1
0
0
0
0
1.72e-06
7.738e-05
4.23
-20
0.0
IV-plateau ends before 150V. Risks of increasing leakage current. Downgraded after consulting with Tilman
IV-plateau ends before 150V. Risks of increasing leakage current.
, LeakageCurrentFQ
M2153
2016-02-08 10:24
2016-05-26 09:45
p17_1
C
91
15
1
0
0
0
0
4.28e-06
4.28e-06
3.01
17
0.0
IV-plateau ends before 150V. Risks of increasing leakage current. Downgraded after consulting with Tilman
IV-plateau ends before 150V. Risks of increasing leakage current.
, LeakageCurrentFQ
M2153 ModuleQualification_Temperature
M2153 ModuleQualification_Humidity
M2153 ModuleQualification_SumOfCurrents
M2153 ModuleFulltestPxar_m20_1
Overview
--- select ---
Chips
_
Vcal Threshold
Summary 1
BumpBondingMap
Summary 2
Summary 3
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
CalDel
PHScale
PHOffset
VthrComp
Vtrim
Vana
Digital Current
Analog Current
IanaLoss
Temperature
Summary ROCs
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
Readback par0ia
Readback par1ia
Readback par2ia
GradingParameters
TBM
Logfile
Errors
M2153 ModuleFulltest_TemperatureCycle
nCycles
nCycles
10
#
CycleTempLow
CycleTempLow
-25
℃
CycleTempHigh
CycleTempHigh
17
℃
M2153 ModuleFulltestPxar_m20_2
Comment
Comment
comments.txt:
IV-plateau ends before 150V. Risks of increasing leakage current. Downgraded after consulting with Tilman
comments.txt~:
IV-plateau ends before 150V. Risks of increasing leakage current.
Overview
--- select ---
Chips
_
Vcal Threshold
Summary 1
BumpBondingMap
Summary 2
Summary 3
IVCurve
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
CalDel
PHScale
PHOffset
VthrComp
Vtrim
Vana
Digital Current
Analog Current
IanaLoss
Temperature
Summary ROCs
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
Readback par0ia
Readback par1ia
Readback par2ia
GradingParameters
TBM
Logfile
Errors
M2153 ModuleFulltestPxar_p17_1
Comment
Comment
comments.txt:
IV-plateau ends before 150V. Risks of increasing leakage current. Downgraded after consulting with Tilman
comments.txt~:
IV-plateau ends before 150V. Risks of increasing leakage current.
Overview
--- select ---
Chips
_
Vcal Threshold
Summary 1
BumpBondingMap
Summary 2
Summary 3
IVCurve
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
CalDel
PHScale
PHOffset
VthrComp
Vtrim
Vana
Digital Current
Analog Current
IanaLoss
Temperature
Summary ROCs
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
Readback par0ia
Readback par1ia
Readback par2ia
GradingParameters
TBM
Logfile
Errors
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