Test Date: 2016-11-02 09:36
Analysis date: 2016-11-02 15:29
FullQualification M1100
|
Module ID
|
Test Date
|
Analysis
|
Test Type
|
Grade
|
Pixel Defects
|
ROCs < 1%
|
ROCs > 1%
|
ROCs > 4%
|
Noise
|
Trimming
|
PHCalibration
|
I(150V)
|
I_rec(150V)
|
IV Slope
|
Temperature
|
initial Current
|
Comments
|
|
M1100
|
2016-11-02 09:36
|
|
m20_1
|
A
|
19
|
16
|
0
|
0
|
0
|
0
|
0
|
2e-08
|
7.4e-07
|
1.14
|
-20
|
0.0
|
|
|
M1100
|
2016-11-02 09:36
|
|
p17_1
|
A
|
18
|
16
|
0
|
0
|
0
|
0
|
0
|
7.6e-07
|
7.6e-07
|
1.08
|
17
|
0.0
|
|
M1100 ModuleQualification_Temperature
M1100 ModuleQualification_Humidity
M1100 ModuleQualification_SumOfCurrents
M1100 ModuleFulltest_TemperatureCycle
| nCycles |
nCycles |
3 |
# |
| CycleTempLow |
CycleTempLow |
-25 |
℃ |
| CycleTempHigh |
CycleTempHigh |
17 |
℃ |
M1100 ModuleFulltest_m20_1
Overview
M1100 ModuleFulltestTrim80_p17_1
Overview
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