Test Date: 2016-11-04 17:17
Analysis date: 2016-11-07 10:48
FullQualification M1116
Module ID
|
Test Date
|
Analysis
|
Test Type
|
Grade
|
Pixel Defects
|
ROCs < 1%
|
ROCs > 1%
|
ROCs > 4%
|
Noise
|
Trimming
|
PHCalibration
|
I(150V)
|
I_rec(150V)
|
IV Slope
|
Temperature
|
initial Current
|
Comments
|
M1116
|
2016-11-04 17:17
|
2016-11-07 08:59
|
m20_1
|
A
|
26
|
16
|
0
|
0
|
0
|
1
|
2
|
2e-07
|
8.83e-06
|
2.32
|
-20
|
0.0
|
|
M1116
|
2016-11-04 17:17
|
2016-11-07 08:59
|
p17_1
|
A
|
65
|
16
|
0
|
0
|
0
|
1
|
9
|
1.96e-06
|
1.96e-06
|
1.37
|
17
|
0.0
|
|
M1116 ModuleQualification_Temperature
M1116 ModuleQualification_Humidity
M1116 ModuleQualification_SumOfCurrents
M1116 ModuleFulltest_TemperatureCycle
nCycles |
nCycles |
3 |
# |
CycleTempLow |
CycleTempLow |
-25 |
℃ |
CycleTempHigh |
CycleTempHigh |
17 |
℃ |
M1116 ModuleFulltest_m20_1
Overview
M1116 ModuleFulltestTrim80_p17_1
Overview
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