Test Date: 2016-11-07 11:20
Analysis date: 2016-11-15 13:43
FullQualification M1132
Module ID
|
Test Date
|
Analysis
|
Test Type
|
Grade
|
Pixel Defects
|
ROCs < 1%
|
ROCs > 1%
|
ROCs > 4%
|
Noise
|
Trimming
|
PHCalibration
|
I(150V)
|
I_rec(150V)
|
IV Slope
|
Temperature
|
initial Current
|
Comments
|
M1132
|
2016-11-07 11:20
|
2016-11-08 10:03
|
m20_1
|
A
|
39
|
16
|
0
|
0
|
0
|
1
|
0
|
2.6e-07
|
1.192e-05
|
1.95
|
-20
|
0.0
|
|
M1132
|
2016-11-07 11:20
|
2016-11-08 10:03
|
p17_1
|
A
|
45
|
16
|
0
|
0
|
0
|
0
|
0
|
7e-07
|
7e-07
|
1.35
|
17
|
0.0
|
|
M1132 ModuleQualification_Temperature
M1132 ModuleQualification_Humidity
M1132 ModuleQualification_SumOfCurrents
M1132 ModuleFulltest_TemperatureCycle
nCycles |
nCycles |
3 |
# |
CycleTempLow |
CycleTempLow |
-25 |
℃ |
CycleTempHigh |
CycleTempHigh |
17 |
℃ |
M1132 ModuleFulltest_m20_1
Overview
M1132 ModuleFulltestTrim80_p17_1
Overview
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