Test Date: 2015-07-07 08:07
Chip 12
X-ray Calibration - Target Zn Method Spectrum Chip C12
Center |
Center of Peak |
52.78 ± 0.09 |
Vcal |
TargetEnergy |
Energy of target Zn |
8638.91 |
eV |
TargetNElectrons |
Energy of target Zn |
2399.7 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
15.15 |
|
Rate |
Rate |
255.10 |
kHz/cm² |
X-ray Calibration - Target Mo Method Spectrum Chip C12
Center |
Center of Peak |
107.12 ± 0.07 |
Vcal |
TargetEnergy |
Energy of target Mo |
17479.37 |
eV |
TargetNElectrons |
Energy of target Mo |
4855.38 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
9.64 |
|
Rate |
Rate |
424.00 |
kHz/cm² |
X-ray Calibration - Target Ag Method Spectrum Chip C12
Center |
Center of Peak |
136.45 ± 0.11 |
Vcal |
TargetEnergy |
Energy of target Ag |
22162.92 |
eV |
TargetNElectrons |
Energy of target Ag |
6156.37 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
6.41 |
|
Rate |
Rate |
234.30 |
kHz/cm² |
X-ray Calibration - Target Sn Method Spectrum Chip C12
Center |
Center of Peak |
156.03 ± 0.12 |
Vcal |
TargetEnergy |
Energy of target Sn |
25271.36 |
eV |
TargetNElectrons |
Energy of target Sn |
7019.82 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
5.66 |
|
Rate |
Rate |
150.50 |
kHz/cm² |
X-ray Calibration - Vcal Calibration Method Spectrum Chip C12
Slope |
Slope |
44.277 ± 0.117 |
nElectrons/VCal |
Offset |
Offset |
112.807 ± 14.689 |
nElectrons |
X-ray Hit Map - Target Zn Method Spectrum Chip C12
Rate |
Rate |
255.10 |
kHz/cm² |
NTrigs |
N Trig |
5919755 |
Trigger |
NHits |
N Hits |
23557 |
Hits |
X-ray Hit Map - Target Mo Method Spectrum Chip C12
Rate |
Rate |
424.00 |
kHz/cm² |
NTrigs |
N Trig |
5919616 |
Trigger |
NHits |
N Hits |
39156 |
Hits |
X-ray Hit Map - Target Ag Method Spectrum Chip C12
Rate |
Rate |
234.30 |
kHz/cm² |
NTrigs |
N Trig |
5915229 |
Trigger |
NHits |
N Hits |
21622 |
Hits |
X-ray Hit Map - Target Sn Method Spectrum Chip C12
Rate |
Rate |
150.50 |
kHz/cm² |
NTrigs |
N Trig |
5919108 |
Trigger |
NHits |
N Hits |
13900 |
Hits |