Test Date: 2015-10-29 13:48
Analysis date: 2015-10-30 19:12
FullQualificationETH M3017
Module ID
|
Test Date
|
Analysis
|
TestCenter
|
Test Type
|
Grade
|
Pixel Defects
|
ROCs < 1%
|
ROCs > 1%
|
ROCs > 4%
|
Noise
|
Trimming
|
PHCalibration
|
I(150V)
|
I_rec(150V)
|
IV Slope
|
Temperature
|
initial Current
|
Comments
|
M3017
|
2015-10-29 13:48
|
2015-10-30 18:14
|
ETHZ
|
m20_1
|
A
|
56
|
16
|
0
|
0
|
0
|
0
|
1
|
-1.0
|
-1.0
|
0.0
|
-20
|
0.0
|
|
M3017
|
2015-10-29 13:48
|
2015-10-30 18:14
|
ETHZ
|
m20_2
|
A
|
55
|
16
|
0
|
0
|
0
|
0
|
4
|
0.0
|
0.0
|
0.0
|
-20
|
0.0
|
|
M3017
|
2015-10-29 13:48
|
2015-10-30 18:14
|
ETHZ
|
p17_1
|
A
|
51
|
16
|
0
|
0
|
0
|
0
|
5
|
0.0
|
0.0
|
0.0
|
17
|
0.0
|
|
M3017 ModuleFulltestPxar_m20_1
Overview
M3017 ModuleFulltest_TemperatureCycle
nCycles |
nCycles |
10 |
# |
CycleTempLow |
CycleTempLow |
-25 |
℃ |
CycleTempHigh |
CycleTempHigh |
17 |
℃ |
M3017 ModuleFulltestPxar_m20_2
Overview
M3017 ModuleFulltestPxar_p17_1
Overview
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