Test Date: 2016-11-08 14:11
Analysis date: 2016-12-13 11:36
OnShellQuickTest M3157
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3157 2016-11-08 14:11 2016-11-28 22:22 OnShellQuickTest_p17_1 C 2428 14 0 2 None None None 1.45 0.9 -1.0 -1 1.29
M3157 ModuleQualification_Temperature
M3157 ModuleQualification_Humidity
M3157 ModuleQualification_SumOfCurrents
M3157 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master