Test Date: 2016-11-09 12:19
Analysis date: 2016-12-13 11:44
OnShellQuickTest M3177
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3177 2016-11-09 12:19 2016-11-28 22:29 OnShellQuickTest_p17_1 A 5 16 0 0 None None None 1.61 0.48 -1.0 -1 0.68
M3177 ModuleQualification_Temperature
M3177 ModuleQualification_Humidity
M3177 ModuleQualification_SumOfCurrents
M3177 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master