Test Date: 2016-11-17 16:06
Analysis date: 2016-12-13 12:04
OnShellQuickTest M3220
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3220 2016-11-17 16:06 2016-11-17 16:09 OnShellQuickTest_p17_1 A 26 16 0 0 None None None 0.65 0.24 -1.0 -1 0.35
M3220 ModuleQualification_Temperature
M3220 ModuleQualification_Humidity
M3220 ModuleQualification_SumOfCurrents
M3220 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master