Test Date: 2016-11-15 14:14
Analysis date: 2016-12-13 12:05
OnShellQuickTest M3222
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3222 2016-11-15 14:14 2016-11-28 22:44 OnShellQuickTest_p17_1 A 24 16 0 0 None None None 0.91 0.26 -1.0 -1 0.38
M3222 ModuleQualification_Temperature
M3222 ModuleQualification_Humidity
M3222 ModuleQualification_SumOfCurrents
M3222 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master