Test Date: 2016-07-06 09:11
Analysis date: 2016-07-26 21:40
M3225 ModuleReceptionTest_p17_1
Chips
Overview
Summary
Module |
Module |
M3225 |
|
Grade |
Grade |
A |
|
ManualGrade |
Manual grade |
- |
|
ElectricalGrade |
Electrical Grade |
A |
|
IVGrade |
IV Grade |
A |
|
DeadPixels |
Dead Pixels |
0 |
|
DefectiveBumps |
Bump Defects |
0 |
|
DefectiveBumpsMax |
Max BumpDef/ROC |
0 |
|
DeadPixelsMax |
Max Dead Pixels/ROC |
0 |
|
Readback |
Readback calibration |
ok |
|
IanaLoss
IanaLossProblems |
Iana problems |
No |
|
Mean |
mean |
19.90 |
|
Min |
min |
18.50 |
|
Max |
max |
20.90 |
|
NROCsNotProgrammable |
ROCs not programmable |
0 |
|
IVCurve
CurrentAtVoltage150V |
I(150 V) |
0.16 |
μA |
Variation |
I(150 V) / I(100 V) |
1.12 |
|
IV150DB |
I(150 V) Fulltest |
0.13 |
μA |
ReadbackStatus
ModuleCalibrationGood |
Readback Calibration |
ok |
|
ReadbackExplanation |
Colors |
Red means not calibrated or parameter value outside of bulk distribution |
|
Database comparison
FULLMODULE_ID
|
GRADE
|
BAREMODULE_ID
|
HDI_ID
|
SENSOR_ID
|
BUILTON
|
BUILTBY
|
STATUS
|
tempnominal
|
I150
|
IVSLOPE
|
PIXELDEFECTS
|
M3225
|
A
|
B350856-06-3
|
1159-12-0001
|
S350856-06-3
|
2016-03-18 17:32:33
|
CERN
|
INSTOCK
|
m20_1
|
0.0
|
1.11
|
2
|
M3225
|
A
|
B350856-06-3
|
1159-12-0001
|
S350856-06-3
|
2016-03-18 17:32:33
|
CERN
|
INSTOCK
|
m20_2
|
0.0
|
1.11
|
3
|
M3225
|
A
|
B350856-06-3
|
1159-12-0001
|
S350856-06-3
|
2016-03-18 17:32:33
|
CERN
|
INSTOCK
|
p17_1
|
1.3e-07
|
1.05
|
4
|
Database comparison - Pixel Defects
MoReWeb-v1.0.2-10-gbc52a17 on branch master