Test Date: 2015-03-24 20:03
R0305 ModuleFullTestPyxar_m20_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module R0305
Grade Grade A
PixelDefects Pixel Defects - A/B/C 6 - 1/0/0
DeadPixels Dead Pixels 2
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 22
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 1
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 22
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2015-03-24
TestTime Test Time 20:03
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 100.10 e
NoiseROCs Noise grades 1/0/0
VcalThrWidth Vcal Thr. Width 145.00 e
VcalThrWidthROCs Vcal Thr. W. grades 1/0/0
RelGainWidth Rel. Gain Width 0.07 %
RelGainWidthROCs Rel. Gain W. grades 1/0/0
PedestalSpread Pedestal Spread 1986.00 e
PedestalSpreadROCs Ped. Spread grades 1/0/0
Parameter1 Parameter1 1.73
Parameter1ROCs Par1 grades 1/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.00 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 16.52 μA
CurrentVariation I(150 V) / I(100 V) 1.37
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 16.52 μA
Variation I(150 V) / I(100 V) 1.37
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 0.00
Noise
mu μ 100.10
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
mu μ 1986.00
Parameter1
mu μ 1.73
Temperature
Temperature Temp. while test -19.97 +/- 0.02 °C
Duration Duration of test 0:00:25
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 6 2 0 1 4 0 0 22 0 0 0
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